Incorporation Kinetics in Mixed Anion Compound Semiconductor Alloys

Abstract

We present a kinetic model predicting anion incorporation in InAsSb. Included are the effects of As desorption, Sb segregation, and Sb displacement by As, any of which may be limited by the In flux if it is comparatively larger. The model captures experimental data over a range of growth conditions for the InAsSb system using activation energies for desorption and Sb segregation found in literature. The activation energy for Sb displacement found in this work is 1.3eV. This model is general and should be valid for other mixed anion systems, or, appropriately modified, mixed cation systems and mixed anion/cation systems such as AlInAsSb.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2013
Accession Number
ADA622567

Entities

People

  • Chris Pearson
  • Evan M. Anderson
  • Joanna M. Millunchick
  • Stefan P. Svensson
  • Wendy L. Sarney

Organizations

  • University of Michigan

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Department Of Defense
  • Desorption
  • Displacement
  • Energy
  • Engineering
  • Equations
  • Experimental Data
  • Heat Of Activation
  • High Resolution
  • Low Temperature
  • Materials
  • Materials Science
  • Metals
  • Military Research
  • Monitoring
  • Semiconductors

Fields of Study

  • Materials science

Readers

  • Computational Modeling and Simulation
  • Electrochemical Engineering/ Fuel Cell Technologies
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics