Gate-Level Commercial Microelectronics Verification with Standard Cell Recognition

Abstract

Within the past two decades, the problem of counterfeit hardware has gained significant attention within the Department of Defense (DoD). Counterfeit electronics compromise national security systems as they may fail to meet durability requirements and/or contain malicious circuits [6, 16, 17]. This necessitates the development of methods to detect counterfeit electronics and prevent the counterfeit electronics from entering DoD systems. The DARPA TRUST program was established to address the need to verify integrated circuit (IC) electronics. This research describes the development of standard cell recognition (SCR) software intended to resolve conflicts in prior TRUST related applications of commercial software to verify IC designs. SCR software applications to circuits composed of up to 650 transistors are presented, and the resulting 90% SCR application success rate is discussed.

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Document Details

Document Type
Technical Report
Publication Date
Mar 26, 2015
Accession Number
ADA623095

Entities

People

  • Leleia A. Hsia

Organizations

  • Air Force Institute of Technology

Tags

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Cell Count
  • Computer Programs
  • Department Of Defense
  • Electronic Components
  • Engineering
  • Governments
  • Integrated Circuits
  • Intellectual Property
  • Inverter Circuits
  • Metal Oxide Semiconductors
  • Microelectromechanical Systems
  • National Security
  • United States
  • United States Government
  • Very Large Scale Integration

Fields of Study

  • Engineering

Readers

  • Cybersecurity.
  • Integrated Circuit Design and Technology.
  • Software Engineering.

Technology Areas

  • Microelectronics