X-Ray Diffraction for Research and Education in Southern Colorado
Abstract
We examined three X-Ray Diffraction systems with an emphasis on thin film applications and their utility in a multi-user environment. We inspected all three systems and communicated with users of each system to determine the strengths and weaknesses of each system. We purchased the Rigaku SmartLab system based on a unique in-plane arm which allows greater thin film analysis capabilities and the automatic component recognition and user guidance software which we feel will be important in a multi-user facility at a smaller institution like ours. The equipment was delivered and installed in November, 2014. Final training by the manufacturer was completed on February 5, 2015. The system has been tested with standard samples for thin film analysis, bulk analysis, powder analysis, small angle x-ray scattering, x-ray reflection, pole figures and reciprocal space mapping. The high temperature capabilities of the instrument were also used to examine the change in crystal structure of a Ba-Fe oxide film. We are currently performing research on a patterned Gd film sample, Cu thin films (75 nm) deposited on Si and SiO2, and Ba-Fe oxide films.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 18, 2015
- Accession Number
- ADA623446
Entities
People
- Thomas M. Christensen
Organizations
- University of Colorado, at Colorado Springs