DURIP: Piezoresponse Force Microscope (PFM) with Controlled Environment for Characterization of Flexoelectric Nanostructures

Abstract

A piezo-force microscope (PFM) system was acquired under this support for characterization of flexoelectric micro/nanostructures in a controlled environment. The system was installed successfully and a few graduate students were trained by the vendor. Both piezoelectric samples and flexoelectric samples were prepared and characterized using this new system.

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Document Details

Document Type
Technical Report
Publication Date
Apr 21, 2015
Accession Number
ADA625299

Entities

People

  • Wenbin Huang
  • Xiaoning Jiang

Organizations

  • North Carolina State University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Human Systems
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Acoustic Detectors
  • Acoustic Resonators
  • Amplifiers
  • Coefficients
  • Composite Materials
  • Department Of Defense
  • Detection
  • Detectors
  • Electromechanical Devices
  • Engineering
  • Materials
  • Measurement
  • Mechanical Properties
  • Nanostructures
  • Piezoelectric Materials
  • Power Amplifiers
  • Students

Readers

  • Materials Science and Engineering.
  • Research Science/Academic Research

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems