IRIS (Integrity and Reliability in Integrated Circuits) Test Article Generation (ITAG)

Abstract

As commercial market forces are driving Integrated Circuit (IC) foundries offshore, the U.S. government is increasingly becoming concerned with the integrity of electronics procured from such offshore, uncontrolled facilities. Similarly, the government is intensely interested in the useful lifespan of these components. DARPA's Microelectronics Technology Office established the Integrity and Reliability in Integrated Circuits (IRIS) program to investigate methods of validating the functionality and reliability of ICs to address this issue. The Information Sciences Institute of the University of Southern California (USC/ISI) proposed to aid the government in performing research in this area by supplying benchmark Test Articles (TAs) to better focus and drive the results of the IRIS program. USC/ISI has the unique blend of skills, IP, and resources, to not only develop and support each test article, but to do so in a cost-effective manner on State-of-the-Art (SoA) process technologies.

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Document Details

Document Type
Technical Report
Publication Date
Mar 31, 2015
Accession Number
ADA627104

Entities

People

  • Jeffrey Draper
  • Matthew French

Organizations

  • University of Southern California

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Energy and Power Technologies
  • Materials and Manufacturing Processes
  • Space

DTIC Thesaurus Topics

  • California
  • Circuit Analysis
  • Circuits
  • Command And Control
  • Computer Programming
  • Computers
  • Fabrication
  • Failure Mode And Effect Analysis
  • Floating Point Operations
  • Information Science
  • Instruction Set Architecture
  • Integrated Circuits
  • Life Tests
  • Networks
  • Reliability
  • Signal Processing
  • Test And Evaluation

Readers

  • Defense Technology Research and Development.
  • Research Science/Academic Research
  • Software Engineering.

Technology Areas

  • Microelectronics