Capacitive Discharge Circuit for Surge Current Evaluation of SiC

Abstract

The power components branch has constructed an apparatus used for surge current testing of prototype semiconductor switch devices. The test apparatus is small-scale. It provides a 1 J pulse at a 5-25 microS pulse width. Shoot-through is a concern in many of the power conversion applications and the pulse provided by this apparatus can provide a very useful model of what device behavior to expect when shoot-through currents occur. Other device characteristics that can also be measured with this apparatus are: maximum current rise rate, forward transconductance, high voltage blocking, required gate charge, and safe operating area.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 2009
Accession Number
ADA629347

Entities

People

  • Mark R. Morgenstern

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Conversion
  • Electronics
  • High Temperature
  • High Voltage
  • Military Research
  • Power Electronics
  • Prototypes
  • Semiconductor Devices
  • Semiconductors
  • Silicon Carbide
  • Solid State Electronics
  • Switches
  • Test And Evaluation
  • Transconductance
  • Voltage

Readers

  • Electrical Engineering
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems