Nanoscale Measurements of Magnetism & Spin Coherence in Semiconductors
Abstract
Under this grant, we have developed state of the art scanning tunneling microscope (STM) instrumentation that is able to characterize spin information on the atomic scale. In particular, we have developed the capability to perform spin polarized STM reliably using a vector magnet STM system and have developed protocols for creating spin polarized STM tips for reliable measurements. We have used these tools to study ferromangnetism in atomic chains of Fe and demonstrated that spin-orbit coupling at the surface of Pb can be detected with spin-polarized STM measurements. In the last year, we have extended our spin polarized measurements to perform energy-resolved spin-resolved STM measurements on spin-polarized localized states of a superconductor created by magnetic defects. These energy-resolved studies are distinct from typical spin-selective measurements performed previously using the STM in any system. In addition, during the last year, we have developed a new platform for study of single spins in Si using specially fabricated Si-on-insultor devices. These SOI devices will provide the samples required for study of spin coherence at a single spin level in a semiconductor, with long coherence time.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 17, 2015
- Accession Number
- ADA631619
Entities
People
- Sangjun Jeon
- Yonglong Xie
Organizations
- Princeton University