The Role of Deep Level Traps in the Optically Controlled Semi-Insulating GaAs Switch
Abstract
A numerical solution for the transient photoconductivity in the laser-activated bulk semi-insulating GaAs switch has been obtained, in which the influence of EL2 and other traps on the optical generation rates and the recombination rates of free carriers has been determined. Calculated photocurrent pulses are compared with the experimental results of switching measurements under conditions of low laser intensity and low device electric field. The comparison shows that the EL2 model is sufficient to explain the large extrinsic photoconductivity which is observed. The dependence of the recovery on the various traps is discussed.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1987
- Accession Number
- ADA635564
Entities
People
- L. Bovino
- M. Weiner
- R. Youmans
- T. Burke