Compact High-Voltage Structures

Abstract

A basic understanding of the critical issues limiting the compactness of high-voltage systems is required for the next generation of impulse generators. In the process of optimizing the design of a highly reliable solid-dielectric over-voltage switch, an understanding of the limiting factors found are shown. Results of a 130kV operating switch, having a modest field enhancement of 16% above the average field stress in the switching region, are reported. The resulting high reliability is obtained by reducing the standard deviation of the switch to 6.8%. The total height of the switch is 1-mm. The resulting operating parameters are obtained by controlling field distribution across the entire switch package and field shaping the desired point of switch closure. The disclosed field management technique provides an approach to improve other highly stressed components and structures.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1997
Accession Number
ADA635799

Entities

People

  • David A. Goerz
  • Michael J. Wilson

Organizations

  • Lawrence Livermore National Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Gaps
  • Alkenes
  • Circuit Boards
  • Dielectrics
  • High Voltage
  • Manufacturing
  • Materials
  • Materials Laboratories
  • Materials Testing
  • Printed Circuits
  • Pulsed Power
  • Reliability
  • Resins
  • Standards
  • Test And Evaluation
  • Test Methods
  • Voltage

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Systems Analysis and Design