Interferometric Measurement of Low-Frequency Phase Noise of an External Cavity Semiconductor Laser
Abstract
The external cavity laser is a good candidate for use in the development of interferometric fiber sensors with small path length differences. This report summarizes an interferometric measurement of phase noise characteristics of a Hewlett-Packard external cavity laser operating in the 1550 nm wavelength band. The measurement was made using an unbalanced Mach-Zehnder fiber interferometer. This result is more than an order of magnitude lower than typically observed with semiconductor diode lasers, but nearly two orders of magnitude greater than that observed for a diode laser-pumped solid-state Nd: YAG laser.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 25, 1995
- Accession Number
- ADA636725
Entities
People
- Antonio L. Deus
Organizations
- Naval Undersea Warfare Center