Photoconductive Switch Characterization by Means of Deep Level Spectroscopy

Abstract

DLTS (deep level transient spectroscopy), PICTS (photo-induced current transient spectroscopy), and EBICTS (electron-beam induced current transient spectroscopy) are experimental techniques to determine the deep level spectrum of non-ideal semiconductors. These methods operate by externally exciting a sample of the material, and then monitoring the time constants of the subsequent return to equilibrium. We analyze the conventional ("rate window") method of evaluating the experimental data obtained by these techniques, and find it wanting in many respects. A new method (termed "spectral analysis") is then presented which is superior both in terms of accuracy and resolution, and which also makes the deep level spectroscopy techniques more suited for numerical evaluation.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1993
Accession Number
ADA637645

Entities

People

  • K. H. Schoenbach
  • R. A. Roush
  • Ralf Peter Brinkmann
  • T. Tessnow

Organizations

  • Naval Surface Warfare Center

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Band Structures
  • Corpuscular Radiation
  • Digital Information
  • Electron Beams
  • Electron Density
  • Electrons
  • Energy
  • Energy Bands
  • Energy Levels
  • Equations
  • Materials
  • Radiation
  • Semiconductors
  • Spectra
  • Spectroscopy
  • Test And Evaluation

Readers

  • Computational Modeling and Simulation
  • Radar Systems Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics