A Statistical Interpretation of the J. C. Martin Relationship for Breakdown of Insulators in Vacuum

Abstract

We discuss the application of Weibull statistics and the J. C. Martin empirical relationship to estimate the cumulative probability of failure of an electrical insulator stressed in vacuum with submicrosecond electrical pulses. We display experimental data and analyze it with Weibull statistics. We apply our results to the design of a much larger insulator (-10[expn 4] cm[expn 2] ) with a desired (10%) cumulative probability of failure.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1985
Accession Number
ADA638614

Entities

People

  • John Shannon
  • Marco S. Dicapua

Organizations

  • Lawrence Livermore National Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Computing-Related Activities
  • Data Science
  • Dielectrics
  • Experimental Data
  • Field Emission
  • Generators
  • Information Science
  • Materials
  • Power
  • Probability
  • Pulsed Power
  • Standards
  • Statistical Analysis
  • Statistics
  • Time Dependence
  • Voltage

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Pulsed Power and Plasma Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics