Transient Response Characterization of Waveform Recorders
Abstract
Test methods for characterizing the transient response of waveform recorders are presented, together with typical test results. The methods, based on the use of a precision, programmable step generator developed at NBS, are suitable for recorders having up to 10 bits of resolution and 100 MHz bandwidth.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1985
- Accession Number
- ADA639232
Entities
People
- D. R. Flach
- H. K. Schoenwetter
- T. M. Souders
Organizations
- National Institute of Standards and Technology