Transient Response Characterization of Waveform Recorders

Abstract

Test methods for characterizing the transient response of waveform recorders are presented, together with typical test results. The methods, based on the use of a precision, programmable step generator developed at NBS, are suitable for recorders having up to 10 bits of resolution and 100 MHz bandwidth.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1985
Accession Number
ADA639232

Entities

People

  • D. R. Flach
  • H. K. Schoenwetter
  • T. M. Souders

Organizations

  • National Institute of Standards and Technology

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Accuracy
  • Bandwidth
  • Capacitance
  • Curve Fitting
  • Errors
  • Frequency
  • Frequency Response
  • Generators
  • Impedance
  • Instrumentation
  • Linearity
  • Measurement
  • Recording Systems
  • Repetition Rate
  • Square Waves
  • Waveforms
  • Waves

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Pulsed Power and Plasma Physics.