Development of an Optically Modulated Scatterer Probe for a Near-Field Measurement System
Abstract
In high-fidelity, near-field measurements, the measurement probe must minimally impact the near-field of the antenna-under-test. To accomplish this, we developed an optically modulated, near-field probe which consists of a rectangular dipole antenna loaded with a photodiode. The modulation scheme separates scattering off of the probe from background reflections. We present the design and performance of an optically modulated scatterer (OMS) probe for use in a near-field measurement system
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 08, 2016
- Accession Number
- ADA640858
Entities
People
- Mark Patrick
- Meredith N. Hutchinson
- Ronaldd D. Schrimpf
Organizations
- United States Naval Research Laboratory