Integrated Circuit Electromagnetic Susceptibility Investigation - Phase 2. Pulse Interference Study
Abstract
The Integrated Circuit Electromagnetic Susceptibility Investigation is concerned with the adverse effects that electromagnetic environments can induce in the integrated circuits used in Navy electronic equipment. Previous work has demonstrated susceptibility of representative linear and digital integrated circuits under CW stimulus at five microwave frequencies: .22, .91, 3.0, 5.6, and 9.1 GHz. Because most of the severe electromagnetic environments to be encountered by sensitive electronic systems will be due to pulsed radar transmitters which typically radiate high peak power in short pulses (1000 times higher power than the average level), it is important to determine the response of the same representative linear and digital devices to pulsed RF signals. A linear 741 operational amplifier and a digital 7400 NAND gate were tested with injected RF pulses as short as one microsecond and at pulse repetition frequencies up to KHz. The basic rectification mechanism which converts the pulsed RF energy to an equivalent video pulse (envelope of the RF pulse) was found to have no minimum time delay (down to one microsecond), and the peak value of the detected pulse corresponds to the level predicted by the CW measurements. Response of the individual circuit to the induced video pulse does depend on the inherent speed capabilities of the device, however. The switching speed and propagation delay time of the 7400 NAND gate are the limiting factors for this device, but the one microsecond pulse width did not approach these limitations.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 12, 1974
- Accession Number
- ADB002277
Entities
Organizations
- McDonnell Douglas