Integrated Circuit Electromagnetic Susceptibility Investigation - Phase 2. Bipolar Op Amp Study
Abstract
The main thrust of Phase II of the Integrated Circuit Electromagnetic Susceptibility Investigation has been to develop a model of the effects to be expected in bipolar integrated circuits under RF stimulus. The approach has been to gather experimental data on the RF susceptibility of representative devices from the digital and linear subcategories, and to analyze the results to uncover the underlying physical phenomena. Prior to the work reported herein, an automated test system was developed and used in studies of a 2-input NAND gate. The 741 operational amplifier was chosen as a representative linear device since it is widely used by equipment designers. The 741 operational amplifier was subjected to test stimuli at the frequencies of 0.22, 0.91, 3.0, 5.6, and 9.1 GHz in the automated test system. The 741 was observed to be more susceptible than the NAND gate to interference by three to four orders of magnitude. Catastrophic failure levels were similar to those for the NAND gate, but a degradation effect was found in the operational amplifier which was not observed in the NAND gate.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 09, 1974
- Accession Number
- ADB002280
Entities
Organizations
- McDonnell Douglas