Investigation of Contamination Effects on Thermal Control Materials

Abstract

Contamination kinetics studied on thick films from DC-704 and RTV-602 (commercial grade) using both infrared ellipsometry and quartz crystal microbalances, confirmed that monomers experience constant deposition rates and reevaporation rates, while polymers have an exponential decay in such areas. Kinetics data was also obtained on a purified form of RTV-602 which showed significantly lower outgassing rates, and on SR-585 silicone adhesive. Limited data was also obtained for RTV's -106 and -560. Measurements were made to obtain effective molecular weight data on outgassing species and their vapor pressure. However, the molecular weight data was not considered reliable due to its wide scatter. The effects of specific contaminants, such as multilayer insulations, a non-reflective black paint, and a bonded silica fabric, was determined on critical properties of different substrates.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1976
Accession Number
ADB014104

Entities

People

  • Rodney M. Linford
  • Thomas A. Hughes
  • Thomas E. Bonham
  • Thomas H. Allen

Organizations

  • McDonnell Douglas

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Space

DTIC Thesaurus Topics

  • Accuracy
  • Body Weight
  • Dermatologic Agents
  • Detectors
  • Materials
  • Materials Laboratories
  • Materials Science
  • Materials Testing
  • Measurement
  • Optical Materials
  • Optical Properties
  • Optics
  • Pressure Measurement
  • Quartz Crystal Microbalances
  • Refractive Index
  • Single Crystals
  • Test And Evaluation

Readers

  • Spectroscopy.
  • Surface Coatings Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene