Small Signal GaAs FET Problems

Abstract

GaAs FETs suffer from a number of problems which reduce performance and tend to keep the price high. In addition, there are a number of tasks related to GaAs FET to be accomplished such as a reliability evaluation and low temperature tests. The program has investigated a number of problems related to stability and performance and in addition, has made an evaluation of the potential reliability of FETs.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1977
Accession Number
ADB017548

Entities

People

  • Harry F. Cooke

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Crystal Structure
  • Electronics
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Frequency
  • Gallium Arsenides
  • Materials
  • Military Research
  • Physical Properties
  • Semiconductors
  • Solid State Electronics
  • Stress Tests
  • Test And Evaluation
  • Test Fixtures
  • Transistors

Readers

  • Semiconductor Device Technology
  • Systems Analysis and Design