Laser Annealing Technique for Improving IR Photoconductive Detectors.

Abstract

A method for improving the performance of off-the-shelf photoconductive detectors by irradiating selected areas of the detectors with a laser pulse of carefully controlled power density and pulse duration. The optimum parameters of the laser radiation will vary according to detector design and are determined experimentally for each type of detector. The laser power density and/or pulse duration is gradually increased from initial values which are well below the damage-threshold values which cause permanent damage to the detector, taking care not to exceed the damage-threshold values, and the detector performance is monitored to determine the parameters of the laser pulse which provides the maximum improvement in detector performance. Once the optimum parameters are determined for a particular type of detector, these values may then be used for assembly-line processing of many detectors of the same type. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1978
Accession Number
ADD005524

Entities

People

  • Filbert J. Bartoli
  • Leon Esterowitz
  • Melvin R. Kruer
  • Roger E. Allen

Organizations

  • United States Department of the Navy

Tags

DTIC Thesaurus Topics

  • Annealing
  • Assembly
  • Assembly Lines
  • Detectors
  • Determinants (Mathematics)
  • Laser Pulses
  • Manufacturing
  • Photoconductive Detectors
  • Radiation
  • Warning Systems

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy