Lattice Matching Measurement Device.

Abstract

This invention pertains to devices for measuring energy gaps of thin multilayered semiconductor devices. In particular it pertains to an apparatus and method which permit nondestructive testing of thin multilayered semiconductors to determine the lattice matching of such devices. This invention also pertains to a device which can serve as a light spectrum analyzer for photon energies corresponding to the gap energies of the multilayers. There will be a direct correlation between the light modulated signal at a given wavelength and the applied DC bias on the device.

Document Details

Document Type
Technical Report
Publication Date
Jan 22, 1979
Accession Number
ADD006029

Entities

People

  • Nickolas Bottka

Organizations

  • United States Department of the Navy

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Analyzers
  • Compound Semiconductors
  • Electronics
  • Energy Gaps
  • Inventions
  • Measurement
  • Nondestructive Testing
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics
  • Spectra
  • Spectrum Analyzers

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Radar Systems Engineering.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics