Method of Selectively Etching a Semiconductor Substrate.
Abstract
The general object of this invention is to provide a method of selectively etching a semiconductor substrate. A further object is to provide such a method in which the resistance of photoresist masking films to semiconductor etchants is increased so that deep etching can take place either through long exposure periods or through the use of vigorous etchants. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 22, 1980
- Accession Number
- ADD007585
Entities
People
- Nicholas O. Korolkoff
- Sidney Marshall
- Vincent E. Rible
Organizations
- United States Army