Test Set for Transient Protection Devices.

Abstract

A method and device for testing protection circuits comprising positive positive and negative high voltage protection circuits and high voltage fast rise time protection circuits. A bipolar tests signal with alternate positive and negative high voltage pulses is applied to the circuit under test. Determination is made whether the pulses are within a predetermined voltage window. Signals indicating pass/fail responsive to that determination are generated. A high voltage fast rise time negative pulse is applied to the circuit under test. Changes in the voltage-time waveform are sensed and compared to predetermined levels. Pass/fail signals are generated in response to the comparison. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 25, 1981
Accession Number
ADD008611

Entities

People

  • John E. B. Tuttle

Organizations

  • United States Army

Tags

DTIC Thesaurus Topics

  • High Voltage
  • Test Sets
  • Voltage
  • Waveforms

Fields of Study

  • Engineering

Readers

  • Electrical Engineering