Real Time Holographic Interferometric Testing of Hybrid Microcircuits.
Abstract
Apparatus for non-destructive testing of hybrid microcircuits using holographic techniques. The apparatus includes a laser, a beam splitter for splitting the laser beam into two beams. The first beam is reflected through a pinhole aperture to a hologram which is positioned between the microcircuit and a detector (video camera or photomultiplier tube). The second beam is reflected through a pinhole aperture to the object (microcircuit), through a lens, and to the hologram. The circuit is energized and displacements due to thermal changes occur as firing movements in the real time interferogram. A detector monitors these changes.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 02, 1981
- Accession Number
- ADD008914
Entities
People
- Gary L. Workman
- Lawrence M. Perry
Organizations
- United States Army