Compound Semiconductor Device Performance and Reproducibility Improvement.

Abstract

This application discloses a method of treating a compound semiconductor substrate material, such as GaAs, to imporove activation efficiency, reproducibility and reliability. The substrate is subjected to a prebombardment to a shallow depth by ions of an element such as Ar, or Ga, or As, which will not significantly affect the doping concentration of the substrate. Ions from an activator element, or elements, are then used for bombardment so that their peak concentration level occurs at a depth of about 80% of the peak concentration level of the prebombardment ions. This provides a very high activation efficiency and a sharp capacitance-voltage profile.

Document Details

Document Type
Technical Report
Publication Date
Oct 26, 1981
Accession Number
ADD009208

Entities

People

  • Max Yoder

Organizations

  • United States Department of the Navy

Tags

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Depth
  • Efficiency
  • Materials
  • Reproducibility
  • Semiconductor Devices
  • Semiconductors
  • Shallow Depth
  • Silicon Carbide
  • Substrates

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics