A nondestructive Noncontact Device to Characterize Semiconductor Material.
Abstract
A semiconductor single crystal wafer is positioned in a magnetic field. A computer initializes the light level and the electronic gain of each detector preamp associated with a fiber optic link from the analyzer. The magnetic field direction would then be reversed by computer command. This would cause a localized change in intensity of light passing through the wafer, due to Faraday Rotation. The resulting change in detector output together with location and wavelength data could be used to compute a map of the wafer. Additional keyword: Patents. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 07, 1985
- Accession Number
- ADD011659
Entities
People
- C. G. Walker
- G. A. Tanton
Organizations
- United States Army