Metal Thickness Measurements Using Radiography
Abstract
The present invention relates broadly to a radiographic inspection technique, and in particular to a metal thickness measurement method using radiography. The localized areas wherein the effective metal thickness is less than the minimum that is required for radiation shielding and which can render a shielding enclosure functionless, is readily determined. The invention comprises a process for assuring metal thickness in small regions. The actual metal thickness of small regions can be verified by comparing the optical densities of sections of the metal i.e. stepwedge. A comparator microphotometer, which compares optical densities of spectrum lines from spectrophotometers, compares the optical density of spectrum lines on an exposed spectrum plate (metal under test) with a standard plate (stepwedge).
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 16, 1986
- Accession Number
- ADD012373
Entities
People
- P. M. Achrekar
Organizations
- United States Department of the Air Force