High-Sensitivity Infrared Polarimeter.
Abstract
This paper discusses an infrared polarimeter that measures the amount or degree of the rotation of the plane of polarization of plane polarized radiation after the radiation has passed through a cadium sulfide (Cds) wafer. Relatively small magnetic fields are used and increased sensitivity is realized by using a chopping wheel to chop the laser beam, providing a reference frequency, and by using a synchronous detector to obtain high signal to noise ratios of the detected signal. As a result of greater sensitivity of the high-sensitivity infrared polarimeter, electronic carrier concentrations as low as 10 to the 15th power /cm 3 can be measured in cadmium sulfide with magnetic fields as low as 0.1 Tesla.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 04, 1987
- Accession Number
- ADD013019
Entities
People
- George A. Tanton
- John A. Grisham
Organizations
- United States Army