Anisotropic Magnetoresistance Measurement Apparatus and Method Thereof.

Abstract

The present invention is an apparatus and method for the nondestructive testing of the anisotropic magnetoresistance parameters of a film. A plurality of contacts points are securely disposed in a generally planar support means and engagable with a surface of the film for measuring the anisotropic magnetoresistance parameters of the film in accord with a predetermined equation. (Patent Applications)

Document Details

Document Type
Technical Report
Publication Date
Jan 20, 1988
Accession Number
ADD013637

Entities

People

  • John M. Cavallo

Organizations

  • United States Department of the Navy

Tags

DTIC Thesaurus Topics

  • Equations
  • Inventions
  • Magnetoresistance
  • Measurement
  • Nondestructive Testing
  • Patent Applications
  • Patents

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Thin Film Deposition Science.