Method for Analyzing Materials Using X-Ray Fluorescence.

Abstract

The invention pertains broadly to x-ray techniques used to analyze materials, and in particular techniques based on x-ray fluorescence. Accordingly, and object of the invention is to enable one to do quantitative elemental analysis using x-ray fluorescence, as well fine structure analysis. Another object of the invention is to enable one to do the foregoing simply, and with one apparatus, and with increased sensitivity, and with less complicated and expensive detectors. Keywords: Patent application; X-ray absorption analysis. (KT)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1988
Accession Number
ADD013895

Entities

People

  • John V. Filfrich
  • Johnny P. Kirkland
  • Timothy Elam

Organizations

  • United States Department of the Navy

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Absorption
  • Advanced Materials
  • Detectors
  • Electromagnetic Wave Detectors
  • Engineered Materials
  • Fluorescence
  • Inventions
  • Materials
  • Patent Applications
  • Patents
  • Sensitivity
  • X Ray Absorption Analysis
  • X Rays

Fields of Study

  • Physics

Readers

  • Molecular Photonics/Laser Physics
  • Systems Analysis and Design
  • Thin Film Deposition Science.