Manual Microcircuit Die Test System.
Abstract
A system for testing semiconductor microchips is provided in which individual microchips can be tested electrically and under specific thermal conditions simultaneously to determine the reliability of the microchip under operating conditions. This system is unique and economically operable so as to enable all individual chips to be tested prior to mounting in larger assemblies. Patent applications. (RH)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 27, 1988
- Accession Number
- ADD013930
Entities
People
- Bernard E. Martin
- Daron C. Holderfield
- Samuel S. Russell
Organizations
- United States Army