Emittance Measuring Device for Charged Particle Beams.
Abstract
The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils 11 which generate an optical transition radiation (OTR) pattern 13; a lens system 14 to collect the OTR pattern 13 from the said foils 11; an optical mask 16 to allow passage of the OTR pattern 13: and a detector array 17 or similar device placed behind the mask 16 which intercepts, senses and measures the point source OTR pattern 13 for each perforation in the mask. Keywords: Patent applications. (jhd)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 05, 1990
- Accession Number
- ADD014687
Entities
People
- Donald W. Rule
- Ralph B. Fiorito
Organizations
- United States Department of the Navy