Rapid, High-Resolution Scanning of Flat and Curved Regions for Gated Optical Imaging

Abstract

A scanning system for scanning in first and second dimensions a desired surface topology of a sample, the scanning device comprising: a light source for producing a collimated light beam; a first scanning device responsive to the collimated light beam from the light source for producing a first scanned beam in a first dimension with a constant optical path length; and a second scanning device coupled between the first scanning device and the sample for focusing and scanning the first scanned beam in a second dimension onto the surface region of the sample to cause the collimated light beam to scan the surface topology of the sample with a constant optical path length in each of the first and second dimensions of the desired topology of the sample. In a second embodiment of the invention, a beam of light is focused by a first lens before a scanner and the scanner is rotated. Second and third lenses arranged in a 4-f combination are used to image rotated focal spots along a spherical convex surface of a sample while the optical path length stays constant. Slow scanning in other dimensions can be performed by mechanical means.

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Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1998
Accession Number
ADD018864

Entities

People

  • John Reintjes
  • Mark Bashkansky
  • Michael A Duncan

Organizations

  • United States Department of the Navy

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Acquisition
  • Ceramic Materials
  • Confocal Microscopy
  • Curvature
  • Fibers
  • Geometry
  • High Resolution
  • Images
  • Inventions
  • Light Sources
  • Optical Scanning
  • Patent Applications
  • Scanners
  • Scanning
  • Three Dimensional
  • Topology
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Image Processing and Computer Vision.
  • Optical Physics and Photonics.