Patterning of GaN Crystal Films with Ion Beams and Subsequent Wet Etching

Abstract

The invention provides a method for etching gallium nitride (GaN) comprising the steps of: providing a GaN film; imagewise amorphizing a portion of the GaN film by ion implantation to form an amorphized portion; and wet etching of the GaN film having an amorphized portion to remove the amorphized portion. When the imagewise amorphizing process can be done without a mask, such as with a focused implantation ion beam, the process itself becomes maskless.

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Document Details

Document Type
Technical Report
Publication Date
Nov 29, 2000
Accession Number
ADD019759

Entities

People

  • Bela Molnar

Organizations

  • United States Department of the Navy

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Chemical Reactions
  • Chemical Vapor Deposition
  • Chemistry
  • Compound Semiconductors
  • Crystals
  • Electronics
  • Etching
  • Gallium Nitrides
  • Inventions
  • Ion Beams
  • Ion Implantation
  • Materials
  • Nitrides
  • Optical Properties
  • Semiconductor Devices
  • Semiconductors
  • Surface Roughness

Readers

  • Nanofabrication and Microfabrication.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene