Dynamic Detecting, Measuring, and Classifying Defects in Telephone Wire Insulation,

Abstract

This paper covers a study of insulation defects and a system that will dynamically measure them. The system uses a planar probe which is electronically adjusted to be two dimensional, normal to the path of the wire. The system consists of two sets of user-set programmable comparators which allows the defects to be classified into three categories: pinholes, faults and bare wire.

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1982
Accession Number
ADP000538

Entities

People

  • Paul G. Koehler
  • T. P. Lichliter
  • Thomas P. Leahy

Tags

DTIC Thesaurus Topics

  • Comparators
  • Insulation
  • New Jersey
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Instructional Design and Training Evaluation.
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems