New Method for the Measurement of Quartz Crystal Resonator Parameters,
Abstract
A network analyser based system has been established which characteristics the crystal response over the region of the resonant and antiresonant frequencies by a set of typically several hundred S12 measurements. A new software system has been developed which determines the equivalent circuit parameters by an iterative algorithm which fits the theoretical response to the measured values in an optimal way. This method is therefore virtually operator independent, and provides excellent resistance to random errors; reproducibility of motional inductance values are of the order of 1 in 10 to the third power.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1982
- Accession Number
- ADP001537
Entities
People
- A. J. Byrne
- A. J. Dyer
- R. C. Peach
- S. P. Doherty
Organizations
- General Electric