A Frequency Domain Reflectometer for Quartz Resonator Investigations,
Abstract
This paper presents the concept and operating principles of a phase modulated, frequency-domain reflectometer system for accurate and precise measurements of the resonant frequency characteristics of quartz crystals. The reflectometer method enables the crystal resonator under test to be remotely located in an environmental test chamber; furthermore, the system permits simultaneous, independent frequency measurements of the various resonant modes that can occur in any given crystal (e.g., the b-mode and c-mode resonances in SC-cut crystals). This reflectometer technique has major applicability in basic resonator research: in investigations of frequency-temperature characteristics; hysteresis and thermal shock effects; amplitude-frequency factor and multimode excitation behavior; effects of nuclear radiation; etc. The instrumentation also has applications in crystal manufacturing processes involving automated production, testing, and quality control.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1982
- Accession Number
- ADP001540
Entities
People
- Charles S. Stone
- O. J. Baltzer
Organizations
- Tracor