Fracture Diagnosis in Structures Using Circuit Analogy,
Abstract
The paper uses the Kirchloff's equations for the T- and II-circuits to analogously simulate the beam vibration. Structures formed by straight beam segments can then be simulated by electrical meshes formed by T- or II-circuits. In the paper the analogous circuits are also developed for the cracked beams. The natural frequencies of the circuits thus yields the natural frequencies of circuits thus yields the natural frequencies of the structures with or without crack. In the inverse application, the change in frequencies leads to the location and assessment of the fracture damage of the structure. The paper developed, specifically for the II-circuit, a formalization of establishing the characteristic matrices. The standardized format makes it possible for adaptation to computer programming. An estimate of the algorithm is included for comparison of its advantage in the speed of computation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1983
- Accession Number
- ADP001732
Entities
People
- Frederick J. Ju
- Mehmet Akgun
- Thomas L. Paez
Organizations
- University of New Mexico