Nanosecond Resolution of E,H and I in Aircraft Lightning Test Rigs,
Abstract
Many designs of test rig have emerged in recent years incorporating hardwired connections (Culham, LTA, etc.) and design incorporating series open arcs at each end of aircraft (McDonnell, etc.). Important characteristics of the test rigs are not specified, but these characteristics control the generation of large (and usually hf) transients through the fast coupling processes (D,B). Both lumped element and distributed element representation of these test rigs and the capacitor banks driving them will be given, and the effects of parameter and geometry variations will be highlighted. It will be shown that quantitative analysis of fast transients (D,B) requires much closer specification of the test rig performance including switch closure time, capacitor bank and connecting line inductance, and the transmission line impedance of the test rig. The recent tests on the Fly-by-Wire Jaguar at Warton near Preston in England showed the need for developing a quantitative relationship between hf transients and the fast coupling processes. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1983
- Accession Number
- ADP002211
Entities
People
- B. J. C. Burrows