A Structured Design of Multiple-Valued LSI/VLSI with Built-In Testing Capability.
Abstract
In this paper a structured design of subsystems of an MV LSI/VLSI chip with built-in testing capability is presented. This structured design which uses multiplexers and DFF's is obtained through the use of a tree-structured ASM chart. Since these circuits are highly structured and the procedure for obtaining the circuit values of the design from the ASM chart is rather straightforward and systematic, this design process may be adapted for automation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1983
- Accession Number
- ADP002328
Entities
People
- K. Santrakul
- S. C. Lee
Organizations
- University of Oklahoma