Characterization of Quartz Crystals by Cathodoluminescence,

Abstract

Cathodoluminescence (CL) in a scanning electron microscope (SEM) is used in the present work for investigating various growth sectors found in synthetic quartz crystals. This is a relatively simple, rapid and non-destructive method which gives a very high resolution. Our results using CL correlate well with those obtained by other methods, e.g. x-ray topography and light scattering tomography. The advantages of CL technique over other methods are described in detail and discussed.

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1983
Accession Number
ADP002474

Entities

People

  • A. Halperin
  • M. Schieber
  • S. Katz

Organizations

  • Hebrew University of Jerusalem

Tags

DTIC Thesaurus Topics

  • Cathodoluminescence
  • Electromagnetic Scattering
  • Electron Microscopes
  • Electrons
  • Frequency
  • High Resolution
  • Light Scattering
  • Microscopes
  • Optical Equipment
  • Optical Magnification Devices
  • Pennsylvania
  • Scanning
  • Scanning Electron Microscopes
  • Scattering
  • Tomography
  • X Rays

Readers

  • Materials Science and Engineering.
  • Medical Imaging.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics