A Measurement Technique for Determination of Frequency vs. Acceleration Characteristics of Quartz Crystal Units,
Abstract
A computer-controlled g-sensitivity measuring apparatus has been assembled and used to screen 100 MHz AT-cut crystal units for any manufacturing defect. This apparatus obtains the g-sensitivity vs. acceleration characteristic of a crystal unit alone in less than 100 seconds in a given direction. The basic equations governing computation of g-sensitivity from the measured data can be used to determine a new set of component requirements for the apparatus when measuring different crystal types to a specified g-sensitivity level. It has already been shown that measurement of g-sensitivity levels less than 10 to the minus 11th power is possible for 100 MHz quartz crystal units. The described g-sensitivity measurement technique can be used to study mechanical resonance properties of crystal mounting and packaging schemes, simply screen defective crystal units, or investigate interfering modes of low frequency mechanical resonances of the crystal plate and supporting systems after a simple modification of the measurement software.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1983
- Accession Number
- ADP002489
Entities
People
- D. J. Healey Iii
- H. Hahn
- Scott W. Powell
Organizations
- Westinghouse Electric Corporation