LES: (Lockheed Expert System): A Model-Based Expert System for Electronic Maintenance,
Abstract
Existing Automatic Test Equipment is often inadequate for quickly isolating component failure in large electronic systems. The Lockheed Expert System (LES) has been designed to guide less-experienced maintenance personnel in the fault diagnosis of electronic systems. LES uses not only the knowledge of the expert diagnostician (captured in the familiar form of IF-THEN rules), but also knowledge about the structure, function, and causal relations of the device under study to perform rapid isolation of the module causing the failure. In addition to aiding the engineer in troubleshooting an electronic device, LES can also explain its reasoning and actions to the user, and can provide extensive database retrieval and graphics capabilities. This discusses the application of LES to a large signal-switching network containing Built-In Test Equipment (BITE). By adding rules, database information, and a few special procedures to the general LES framework, we were able to have a working system in a much shorter time (four man-months) than would have been possible starting afresh.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1984
- Accession Number
- ADP003944
Entities
People
- O. Firschein
- T. J. Laffey
- William Perkins
Organizations
- Lockheed Martin Missiles and Space