Ferroelectric PbZr0.2Ti0.803 Thin Films on Epitaxial Y-Ba-Cu-O,

Abstract

Using a combination of pulsed laser deposition and sol-gel processing, we have fabricated epitaxial PbZr0.2Ti0.8O3/YBa2Cu3O7-x heterostructures on single crystalline 001 LaAlO3. Rutherford back-scattering studies show the composition to be the same as the nominal starting composition. Transmission electron microscopy shows the existence of a randomly oriented polycrystalline microstructure in the PZT layer with a grain size of about 500-1000A. Microscopic pores were also observed in the PZT layer. The PZT film exhibits ferroelectric hysteresis with a saturation polarization of 22-25 micron C/cm2 (at 7.5V, lkHz), a remanence of 5-6 micro C/cm2 and a coercive field of about 40kV/cm.

Document Details

Document Type
Technical Report
Publication Date
Apr 05, 1991
Accession Number
ADP006642

Entities

People

  • A. Inam
  • B. Wilkens
  • F. Tillerot
  • R. Ramesh
  • W.k. Chan

Tags

DTIC Thesaurus Topics

  • Colorado
  • Electron Microscopy
  • Electrons
  • Films
  • Grain Size
  • Heterojunctions
  • Hysteresis
  • Lasers
  • Microscopy
  • Microstructure
  • Optical Analysis
  • Polarization
  • Polycrystals
  • Pulsed Lasers
  • Thin Films
  • Transmission Electron Microscopy

Fields of Study

  • Materials science
  • Physics

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene