Preparation, Microstructure, and Ferroelectric Properties of Laser-Deposited Thin Batio sub3 and Lead Zirconate-Titanate Films,

Abstract

Ferroelectric thin films of BaTiO3 and lead zirconate titanate, PbZro.53Tio.4703 (PZT), have been prepared by pulsed excimer laser deposition. The microstructure and crystallography of these films have been studied by scanning electron microscopy (SEM), energy dispersive x-ray spectrometry (EDX), transmission electron microscopy (TEM), xray diffraction (XRD), and differential scanning calorimetry (DSC). Electrical properties, including remanent polarization, dielectric loss, and dielectric constant, have been measured. Also, switched remanent polarization has been measured under conditions of continuous cycling.

Document Details

Document Type
Technical Report
Publication Date
Apr 05, 1991
Accession Number
ADP006645

Entities

People

  • B. J. Rod
  • K. W. Bennett
  • L. P. Cook
  • P. K. Schenck
  • P. S. Brody

Organizations

  • Harry Diamond Laboratories

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Dielectric Permittivity
  • Diffraction
  • Electrical Properties
  • Electron Microscopy
  • Excimer Lasers
  • Films
  • Lead Zirconate Titanates
  • Microscopy
  • Scanning Electron Microscopy
  • Thin Films
  • Titanates
  • Transmission Electron Microscopy
  • X Rays
  • Zirconates

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Powder metallurgy of Titanium alloys.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene