Characterization of a New Photorefractive Material:K sub 1-y, L sub y, T sub 1-x, N sub x,
Abstract
We have demonstrated the growth of a new photorefractive material, KLTN, and have characterized its photorefractive properties. The crystal was of good quality with a phase transition at 178 (dot) K. It displayed a strong quadratic photorefractive effect with a sensitivity of 0.0000724. The maximum diffraction efficiency observed was 75% with a corresponding coupling constant of Gamma = 1.75/cm. The writing times were given by tau sub write = 6 sec-sq.cm/W, and there was a strong read/write time asymmetry. The photorefractive process was shown to be voltage 'controllable. Based on this work, KLTNs seem to be highly promising materials for volume hologram storage applications.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 22, 1992
- Accession Number
- ADP006696
Entities
People
- Aharon J. Agranat
- Amnon Yariv
- Rudy Hofmeister
- Victor Leyva
Organizations
- Nankai University