Model Study of Refractive Effects on X-Ray Laser Coherence,
Abstract
The role of smoothly varying transverse gain and refraction profiles on x-ray laser intensity and coherence is analyzed by modally expanding the electric field within the paraxial approximation. Comparison with a square transverse profile reveals that smooth-edged profiles lead to: (1) a greatly reduced number of guided modes, (2) the continued cancellation of local intensity from a loosely guided mode by resonant free modes, (3) and the absence of extraneous (or anomalous) free mode resonances. These generic spectral properties should enable a considerable simplification in analyzing and optimizing the coherence properties of laboratory soft x-ray lasers.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 22, 1992
- Accession Number
- ADP007056
Entities
People
- Moshe Strauss
- Peter Amendt
- Richard A. London
Organizations
- Lawrence Livermore National Laboratory