Reflection Mask Technology for Soft-X-Ray Projection Lithography,
Abstract
Soft X-ray Projection Lithography (SXPL) may be used to fabricate high resolution structures for future integrated circuits. This technique will use a reflection mask which is a substrate coated with an x-ray multilayer mirror and patterned with a thin layer of x-ray absorber. Mask patterning processes must not degrade the reflectivity of the x-ray mirror and mask repair techniques must be developed.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 22, 1992
- Accession Number
- ADP007237
Entities
People
- A. M. Hawryluk
- D. P. Gaines
- D. W. Phillion
- N. M. Ceglio
- R. Browning
Organizations
- Lawrence Livermore National Laboratory