Improvement of the Minimum Detectability of Electro-Optic Sampling by using a Structurally New Probe,

Abstract

The noise in Electro-Optic (E-0) sampling system is examined and is proved to be mainly due to wavelength dependence on the modulation. Then, we propose a structurally new E-0 probe for noise reduction. Use of a new E-0 probe having a spontaneous birefringence compensation crystal reduces the noise and resulted in a 6 f old improvement in minimum detectability. Finally, We have achieved a minimum detectable voltage of 7 mV/ Hz with 32 ps time resolution at d = 0.

Document Details

Document Type
Technical Report
Publication Date
May 22, 1992
Accession Number
ADP007642

Entities

People

  • Hironori Takahashi
  • Isuke Hirano
  • Shinichiro Aoshima
  • Yutaka Tsuchiya

Organizations

  • Optica

Tags

DTIC Thesaurus Topics

  • Birefringence
  • Compensation
  • Electronics
  • Modulation
  • Noise
  • Noise Reduction
  • Optical Phenomena
  • Optics
  • Optoelectronics
  • Picosecond Time
  • Sampling

Readers

  • Electrical Engineering
  • Optical Physics and Photonics.
  • Systems Analysis and Design