X-Ray Scattering Studies of Correlated Interface Roughness in Multilayers,

Document Details

Document Type
Technical Report
Publication Date
Mar 05, 1992
Accession Number
ADP008039

Entities

People

  • C.f. Majkrzak
  • I.k. Schuller
  • M.k. Sanyal
  • S.k. Satija
  • Sudipta Kumar Sinha

Tags

DTIC Thesaurus Topics

  • Electromagnetic Scattering
  • Roughness
  • Scattering
  • Wave Phenomena
  • X Ray Scattering
  • X Rays