Multilayer X-Ray Mirror Absolute Reflectivity, Energy Band Pass and Overlapping Order Determination Using an X-Ray Tube and a SI(LI) Detector,
Abstract
X-ray interference mirrors are a particular case of artificial multilayered media for which the wanted property is a high intensity of the diffraction phenomena itself. For such applications ons needs to know the performance of the mirrors at different wavelengths. We would like to demonstrate here how such X-ray reflectivity tests can be achieved on a laboratory apparatus to got absolute reflectivity and without the need of a synchrotron source.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 05, 1992
- Accession Number
- ADP008053
Entities
People
- H. Duval
- J.c. Malaurent
- P. Dhez
Organizations
- University of Paris-Sud